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Suppression of Cu6Sn5 in TiO2 reinforced solder joints after multiple reflow cycles

机译:多次回流焊后抑制TiO2增强焊点中的Cu6sn5

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摘要

In the current generation of 3D electronic packaging, multiple reflows are often required during soldering. In addition, electronic packages may be subjected to additional solder rework or other heating processes. This paper investigates the effects of multiple reflow cycles on TiO2 reinforced Sn–0.7Cu solder fabricated by a powder metallurgy microwave sintering technique. Compared to TiO2-free equivalents, a relative suppression of the Cu6Sn5 phase, both as primary crystals and as an interfacial layer was observed. The likely mechanism relates to the TiO2 nanoparticles promoting nucleation and decreasing the amount of time that liquid is in contact with the interfacial layer. The TiO2 particles appear to stabilise the interfacial Cu6Sn5 layer and result in a more planar morphology. The suppression of Cu6Sn5 results in TiO2 reinforced solder joints having a higher shear strength after multiple reflow cycles compared to Sn–0.7Cu solder joints.
机译:在当前的3D电子封装中,焊接过程中经常需要多次回流。另外,电子封装可能会经受额外的焊料返工或其他加热过程。本文研究了多种回流循环对粉末冶金微波烧结技术制备的TiO2增强Sn-0.7Cu焊料的影响。与不含TiO2的等效物相比,观察到相对抑制了Cu6Sn5相的初生晶体和界面层。可能的机理与TiO2纳米颗粒促进成核作用并减少液体与界面层接触的时间有关。 TiO2颗粒似乎可以稳定界面Cu6Sn5层并导致更平坦的形态。与Sn–0.7Cu焊点相比,Cu6Sn5的抑制导致TiO2增强的焊点在多次回流之后具有更高的剪切强度。

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